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As ASICs grow in size and power, managing thermal stress is critical. Henkel’s latest article explores how next-gen thermal interface materials (TIMs) reduce die warpage, resist pump-out, and improve reliability in high-performance electronics.
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As ASIC dies become more power-dense and footprints expand to enable greater function, warpage can become exacerbated. Some die in modern AI devices can measure as large as 60 mm x 60 mm, and those dimensions only stand to increase.
The challenge is developing a low thermal impedance, thin, pump-out resistant TIM to secure efficient heat transfer and improve reliability even after thousands of thermal cycles. Naturally, material properties can be modified to address aspects like adhesion and viscosity, but these alterations may also have undesirable consequences.
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